Characterization of Defect Modes in One- Dimensional Ternary Metallo-dielectric Nanolayered Photonic Crystal

We investigate the characterization of defect modes in one-dimensional ternary symmetric metallo-dielectric photonic crystal (1DTSMDPC) band-gap structures. We consider the defect modes for symmetric model with respect to the defect layer. We demonstrate reflectance with respect to the wavelength and its dependence on different thicknesses and indices of refraction of dielectric defect layer, angle of incidence and number of periods for both transverse electric (TE ) and transverse magnetic (TM ) waves. Also, we investigate properties of the defect modes for different metals. Our findings show that the photonic crystal (PC) with defect layer, made of two dielectrics and one metallic material, leads to different band-gap structures with respect to one dielectric and one metallic layer. There is at least one defect mode when we use dielectric or metallic defect layer in symmetric structure. And, the number of defect modes will be increased by the enhancement of refractive index and thickness of dielectric defect layer.